发明名称 SEMICONDUCTOR MEMORY CELL
摘要 PURPOSE:To assure sufficiently reliability even if being made fine, by arraying a first address line second address line so that they are not overlapped with each other, and by forming close an N-type region and P-type region is the direction of the channel width on the semiconductor surface between both the address lines. CONSTITUTION:A conductor layer 6 being a first address line and a conductor layer 7 being a second address line are arrayed not so as to be overlapped with each other. A first FET 51 may be an N-channel MOSFET, a second FET 52 a P-channel MOSFET, and a third FET 53 an N-channel junction type FET. For example, a first reference potential may be 3V, a second reference potential may be 0v, a threshold voltage of the first FET may be 1.0V a threshold voltage of the second FET may be 1.0V at 0V of the substrate voltage and may be 0.5V at 3V of the substrate voltage, and a threshold voltage of the third FET may be -2.0V. At this time, binary information can be stored by charging or discharging a capacitor 54, etc., being connected with P-type regions 52b, 53g1 which are under an electrically floating state.
申请公布号 JPS61236158(A) 申请公布日期 1986.10.21
申请号 JP19850077945 申请日期 1985.04.12
申请人 NEC CORP 发明人 KUROSAWA SUSUMU
分类号 H01L27/10;H01L27/108 主分类号 H01L27/10
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