发明名称 FIELD EFFECT TRANSISTOR
摘要 PURPOSE:To realize a small positive threshold value with good reproducibility and uniformity by a method wherein an undoped semiconductor layer and an N<+> type semiconductor layer are formed on a semiconductor with a small electron affinity. CONSTITUTION:An undoped GaAs layer 12 (thickness 3-30nm) is provided between an undoped AlxGa1-xAs layer 3 and an N<+> type GaAs layer 5. As electrons leak out of the N<+> type GaAs layer 5 into the undoped GaAs layer 12 by thermal energy, the undoped GaAs layer 12 is charged negative. By this negative charge, a potential gradient is created in the undoped GaAs layer 12 along the direction of pushing back electrons from the undoped GaAs layer 12 to the N<+> type GaAs layer 5 and an edge of the conduction band of an undoped GaAs layer 2 is lifted in Fermi energy by energy DELTAE. Therefore, a threshold VTH takes a positive value DELTAE.
申请公布号 JPS61231769(A) 申请公布日期 1986.10.16
申请号 JP19850073855 申请日期 1985.04.08
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 ARAI KUNIHIRO;MIZUTANI TAKASHI
分类号 H01L29/812;H01L21/338;H01L29/778;H01L29/80 主分类号 H01L29/812
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