发明名称 IC TESTING APPARATUS
摘要 PURPOSE:To certainly attach and detach an IC socket board and to improve attachment and detachment operability, by bringing the connector of an IC testing apparatus to the contact or non-contact state with the contact terminal of the IC socket board in response to the operation of a lever. CONSTITUTION:When an operation lever 64 is revolved by 180 deg., transmission shafts 46a, 46b are revolved through helical gears 56, 58 and a connection lever 30 is displaced. By this mechanism, an operation shaft 23a is cooperated and revolved by 90 deg. to bring the connector 23 of an IC testing apparatus and the contact terminal 74a of the terminal plate of an IC socket board 14 to a non- contact state. Therefore, the frictional resistance of the terminal 74a and the socket 23 is almost eliminated and the attachment and detachment of the IC socket board with respect to the IC test apparatus is certainly performed with good operability.
申请公布号 JPS61228368(A) 申请公布日期 1986.10.11
申请号 JP19850069797 申请日期 1985.04.01
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 YANAGI KUNIO
分类号 G01R31/28 主分类号 G01R31/28
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