发明名称 SURFACE-DEFECT INSPECTING APPARATUS
摘要 PURPOSE:To obtain parameter data online, by obtaining the optical image data on the object surface to be inspected, detecting the characteristic data of the surface defects, storing the data in a memory, and performing computation using the kind data and the characteristic data of the surface defects inputted by an input means. CONSTITUTION:A line sensor is arranged so as to face the object surface to be inspected of a steel plate 1, which is conveyed on a line. The output of the sensor is inputted to an image memory 7 through a signal processing circuit 5. The data is read out of the image memory 7 and inputted to a characteristic extracting circuit 8. The characteristic data of the surface defects of the steel plate 1 is extracted and inputted to a data memory 12 and a judging circuit 14. The data is also supplied to an image display device 9 through a display control circuit 10. The image displayed on the image display device 9 is visually observed, and the kind data and the characteristic data of the surface defects are inputted by an input device 11 and stored in a data memory 12. A parameter setting circuit 13 sets the adequate parameter data based on said data.
申请公布号 JPS60207004(A) 申请公布日期 1985.10.18
申请号 JP19840063738 申请日期 1984.03.31
申请人 TOSHIBA KK 发明人 NAGAO YUKIO;FUKAZAWA CHIAKI
分类号 G01B11/30;G01B11/24;G01B11/245;G01N21/88 主分类号 G01B11/30
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