| 摘要 |
PURPOSE:To detect easily and rapidly the contact accident between plural wirings which are not mutually connected in the circuit constitution by having a scanning means to impress successively the test signal to plural respective wirings which are not mutually connected, and a contact detecting means to judge that the contact exists between wirings at the time of detecting that the test signal exists. CONSTITUTION:Respective pins of a chip carrier type target CPU 20 built in a debugging device 14A are connected to a flat cable 22 which is protruded from the device through a connector at the debugging device 14A side to the external part. A chip carrier type connector 18A is provided at the tip of the flat cable 22. The presence and the absence of the contact accident generated due to the inserting fault of the connector 18A and a socket 12A for CPU in data lines DALO-DALF are checked at the debugging device 14A side. To three state buffers LBO-LBF and strobing input terminals of HBO-HBF, the scanning pulse is successively inputted from a scanning pulse generating circuit 38 with LBO and HBO, LBI and HBI...LBF and HBF as a pair.
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