发明名称 MEASUREMENT OF AMPLIFIER
摘要 PURPOSE:To automatize the inspection, by a method wherein a reference input signal is inputted into an amplifier to be measured to obtain a signal to be measured and the product of the input signal and the output signal is integrated to judge the propriety of the characteristic of the amplifier being measured based on the output level obtained. CONSTITUTION:A reference signal generator 2 is adjusted to a specified level with a specified frequency and the level of a reference signal to be supplied into an amplifier 1 to be inspected is adjusted with an attenuator 3 so that the output voltage of a load 4 will come to a specified value. Then, a multiplier 9 receives the output of the amplifier 1 and the output signal (reference signal) of the generator 2 to multiply. Then, the output of the multiplier 9 is integrated with an integrator 10, the output of which is inputted into a level meter 7 to detect the output voltage of the integrator 10 so that it can be found how much the output waveform of the amplifier 1 shifts from the waveform of the reference signal depending on the difference of the levels. This enables the judgement on the quality of the amplifier 1 from the shift, thereby automatizing the inspection of signals with any complicated waveform.
申请公布号 JPS61225664(A) 申请公布日期 1986.10.07
申请号 JP19850067273 申请日期 1985.03.29
申请人 NEC KANSAI LTD 发明人 YAGI TAKASHI
分类号 G01R23/20;G01R31/00 主分类号 G01R23/20
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