发明名称 MEMORY CELL TESTIFIER BASED ON DROP IN THRESHOLD OBTAINABLE DURING WRITING
摘要 <p>A comparator has two inputs, one controlled by a circuit branch including a written cell being examined and one controlled by another circuit branch including a virgin cell. In parallel with the latter is placed another reference cell controlled in an adjustable manner in such a way as to raise the threshold of the written cell which the device is able to discriminate and accept.</p>
申请公布号 JPS61224200(A) 申请公布日期 1986.10.04
申请号 JP19860059645 申请日期 1986.03.19
申请人 SGS MICROELETTRONICA SPA 发明人 JIURIO KASAGURANDE;ROBERUTO GASUTARUDEI
分类号 G11C29/00;G11C16/02;G11C16/06;G11C16/34;G11C17/00;G11C29/12;G11C29/50 主分类号 G11C29/00
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