发明名称 PROCESS AND APPARATUS FOR CHEMICAL VAPOR DEPOSITION OF FILMS ON SILICON WAFERS
摘要 A process for depositing films of uniform thickness on silicon wafers at a uniform deposition rate among all wafers processed at the same time. The wafers are vertically oriented and arranged in a spaced-apart mutually parallel fashion and are supported within a horizontally-oriented long quartz tube which is evacuated at one end by a vacuum pump. A heating element surrounding the tube heats the wafers supported within it. At least one type of reactant gas is introduced into the enclosure in a generally confined region below the wafers and between the wafer arrangement and a wall of the enclosure. The gas, which is directed upwards between adjacent wafers and dispersed across the entire surface of the wafers, chemically reacts to deposit a uniform film on the wafers. Unreacted and exhaust gases are evacuated from the enclosure by the vacuum pump in a horizontal direction of flow above the wafer arrangement.
申请公布号 IE51091(B1) 申请公布日期 1986.10.01
申请号 IE19810001017 申请日期 1981.05.08
申请人 ADVANCED CRYSTAL SCIENCES, INC. 发明人
分类号 H01L21/205;C23C16/44;C23C16/455;C30B25/00;C30B25/10;C30B25/14;H01L21/31;(IPC1-7):C03B25/10 主分类号 H01L21/205
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