发明名称 EVALUATION OF WAVEGUIDE CHARACTERISTIC
摘要 PURPOSE:To detect phase difference between vertical and horizontal modes in the passage of resonance mode light through a waveguide, by measuring the angle of resonance mode polarization of a resonator composed of reflecting mirrors facing each other sandwitching a double refraction waveguide and a wavelength plate between the waveguide and the reflecting mirror. CONSTITUTION:A wavelength plate 8 is inserted in the direction inclined by 45 deg. with respect to either vertical or horizontal mode light and a polarizing angle detector 9 is provided behind a reflecting mirror 6 to detect the angle of polarization of a resonance mode light leaking from the reflecting mirror 6. The phase difference between vertical mode light and horizontal one during one round trip thereof passing through a double refraction waveguide 2 is calculated by detecting the angle of polarization as generated until the resonance mode light reflected by a reflecting mirror 7 reaches the reflecting mirror 6 to be doubled. The angle of polarization of light of resonance mode reaching the reflecting mirror 6, namely, that leaked from the reflecting mirror 6 is detected with the detector 9. As the difference between the two angles corresponds to the phase difference with the passage through the waveguide 2, the phase difference between vertical mode light and horizontal one is calculated during one round trip thereof passing through the waveguide 2 by doubling the phase difference.
申请公布号 JPS61217729(A) 申请公布日期 1986.09.27
申请号 JP19850059825 申请日期 1985.03.25
申请人 FUJITSU LTD 发明人 SHIRASAKI MASATAKA;NAKAJIMA HIROKI
分类号 G01J9/00;G01J4/00 主分类号 G01J9/00
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