发明名称 LIGHT SCATTERING IMAGE INFORMATION ANALYZING DEVICE
摘要 PURPOSE:To eliminate a scanning of luminous flux or an object to be tested and enable observation at the spot and direct observation of desired section without image processing by converging luminous flux into slitlike form, and illuminating the object to be tested and transmitting the luminous flux simultane ously over the whole face of desired section. CONSTITUTION:The device is provided with a laser light source 1, a mirror 2, an optical system 3, a sample 4, an observation optical system 5 and a photosensitive material 6. The light beam from the light source 1 is determined the optical path by the mirror 2 and is made incident on the optical system 3. The incident beam is made incident horizontally on the side of the sample 4 by the optical system 3 as a line beam L. Consequently, the beam L transmits the sample 4, and scattered during the process. Out of the scattered light, light nearly perpendicular to the optical axis of the beam L enters the observation optical system 5 and becomes observable. Thus, by making the luminous flux a line beam, the whole of desired section of the sample 4 can be illuminated simultaneously, and scanning of the beam L, sample 4, material 6 etc. becomes unnecessary, and the scattered light can be observed at the spot and directly observed over the whole face simultaneously.
申请公布号 JPS61213652(A) 申请公布日期 1986.09.22
申请号 JP19850053369 申请日期 1985.03.19
申请人 MITSUI MINING & SMELTING CO LTD 发明人 MORIYA KAZUO
分类号 G01N21/17;G01N21/47;G01N21/49;G01N21/51;G01N21/64;G02B21/00;G02B27/02 主分类号 G01N21/17
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