发明名称 APPARATUS FOR DETECTING FLAW OF MIRROR REFLECTION CHARACTERISTIC SURFACE
摘要 PURPOSE:To make it possible to easily detect a flaw only by a density value by extracting the density levels of a normal part and a flaw part in a largely different form, by utilizing the reflective characteristics of the mirror surface of an object to be inspected and a light source corresponding to a rotary surface. CONSTITUTION:For example, in detecting the flaw of the mirror reflective surface 1-1 of cone shaped matter to be inspected, a circumferential shape irradiation light source 2 such as a circular lamp is used and a TV camera 3 is arranged above said light source 2. When the light source 2 is present at the position of a drawing (a), the image data 1' inputted to the TV camera 3 consists of a ring shaped bright part 1-1-0, a dark part 1-1, and a circular dark part 1-2'. In this state, the light source is downwardly moved to the position shown by a drawing (c) to gradually change the distance between the light source 2 and the matter 1 and data from the ring shaped image data 1-1-0 present at the uppermost position of an inclined surface to the ring shaped image data 1-1-n present at the lowermost position of said inclined surface are successively obtained. In a flaw A is present on the surface of the matter 1, image data, wherein a dark part A' is present on a part of a ring shaped bright part 1-1-m, is obtained.
申请公布号 JPS61213752(A) 申请公布日期 1986.09.22
申请号 JP19850057076 申请日期 1985.03.20
申请人 AGENCY OF IND SCIENCE & TECHNOL;FUJITSU LTD 发明人 IKEUCHI KATSUSHI;OSADA SHIGEMI
分类号 G01B11/30;G01N21/84;G01N21/88;G06T1/00;H04N7/18 主分类号 G01B11/30
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