发明名称 TEST SYSTEM FOR MICROPROCESSOR DEVICE
摘要 PURPOSE:To display a test result on a display means by taking a test in response to an indication from an input means according to a test program stored in a microprocessor. CONSTITUTION:The item number and start of a test are inputted with KEY 2. The microprocessor CTL1 detects the item number of the test according to the order of the KEY 2 and the address of the program is set in the starting address of the ROM 6 in an external testing device ETST 5. The ROM 6 starts the test program under microprogram control to test a specified position of the CTL1, and the result of a normal end of abnormal end is reported as data to the CTL1, which displays the result on a display device DSP 3 as 'GOOD' or 'NO GOOD'.
申请公布号 JPS61208138(A) 申请公布日期 1986.09.16
申请号 JP19850047407 申请日期 1985.03.12
申请人 OKI ELECTRIC IND CO LTD 发明人 SAWADA MASAZUMI;FUJII SATORU
分类号 G06F11/22 主分类号 G06F11/22
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