发明名称 |
Test input demultiplexing circuit |
摘要 |
A test signal, used to initialize an integrated circuit chip for testing, is multiplexed with a data input line of the chip. The test signal circuitry is inactivated during normal operation of the chip. The test circuitry is activated only when a special input signal, which is a voltage at some midpoint between logic states, is applied to the data input.
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申请公布号 |
US4612499(A) |
申请公布日期 |
1986.09.16 |
申请号 |
US19830549121 |
申请日期 |
1983.11.07 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
ANDRESEN, BERNHARD H.;KEENEY, STANLEY C. |
分类号 |
G01R31/28;G01R19/165;G01R31/317;G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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