发明名称 DETECTOR FOR UNEVEN SURFACE INFORMATION
摘要 PURPOSE:To improve the contrast of an uneven surface and to reduce the size of a detector by arranging an optical element at distance from the uneven surface contacting part of a transparent flat plate and leading out and detecting only projection part information incoming while by being reflected totally. CONSTITUTION:When the uneven surface 5 such as a fingerprint is irradiated by a light source 2 while pressed against the transparent flat plate 1, light 16 scattered by a recessed part 10 is made incident on and refracted by the transparent flat plate 10, and then all projected from the transparent flat plate 1 at the angle of the incidence on the transparent flat plate 1. Light scattered by a projection part 9, on the other hand, enters the transparent plate 1 and its component less than the critical angle is projected to below the transparent plate, but the component larger than the critical angle is propagated in the transparent plate 1 while reflected totally by transparent plate/air interfaces. The light propagated in the transparent plate 1 reaches the optical element 3, where its total reflection condition is not satisfied, so the light enters the optical element 3 from its interface and is guided out. Then, an external detector 4 detects pattern information from only the projection part 9.
申请公布号 JPS61201380(A) 申请公布日期 1986.09.06
申请号 JP19850041437 申请日期 1985.03.03
申请人 FUJITSU LTD 发明人 EGUCHI SHIN;IGAKI SEIGO;YAHAGI HIRONORI;YAMAGISHI FUMIO;IKEDA HIROYUKI;INAGAKI YUSHI
分类号 G02B5/04;A61B5/117;G01B11/30;G02B27/00;G06K9/20;G06T1/00 主分类号 G02B5/04
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