| 摘要 |
<p>METHOD OF TESTING BUBBLE MEMORY DEVICES A method of testing bubble memory devices each having a plurality of minor loops, the method being useful for detecting defective minor loops in a short time. In this method, data to be written in and/or data to be read out is divided into a plurality of blocks, the bubble memory device is sequentially operated under driving magnetic field and/or bias magnetic field conditions different for every block, and a defective minor loop or loops are detected by comparing readout data with write in data.</p> |
