发明名称 CIRCUIT SUBSTRATE INSPECTION INSTRUMENT
摘要 PURPOSE:To test a double-sided circuit board positively by one step at a time as to the current conduction to improve testing efficiency and reliability by providing a stationary plate having an upper pinboard through plural guide posts on a supporting baseplate, a lower pinboard having contact pins and an extracting plate on which to place the body to be tested. CONSTITUTION:Two guide wheels 19 integral with the extracting plate 18 are slid forwards by pulling a handle 17 forward. The double-sided board W to be inspected is inserted to the respective guide pins 20 of the thus pulled out extracting plate 18. The extracting plate 18 is inserted into the original position while simultaneously a double-ended lock handle 27 is turned inwards so that the engaging pin 28 is engaged in the engaging aperture 26a and lowered to turn on switches S1, S2. The motor 29 is driven into rotation, cams 30, 31 are rotated, the lower pinboard 8 and the holding member 10 are elevated against springs 14, 15 by the intermediary of an operating lever 33 against the action of springs 14, 15, current conducting contacts of the substrate W are contacted with the respective contact pins 22 of the upper pinboard 21 and current conducting contacts of the substrate W are contacted with contact pins 9 of the lower pinboard 8 so as to permit the inspection.
申请公布号 JPS61195367(A) 申请公布日期 1986.08.29
申请号 JP19850036147 申请日期 1985.02.25
申请人 YOKOWO MFG CO LTD 发明人 NAKAJIMA KO;SAIDA KATSUTOSHI
分类号 G01R31/02 主分类号 G01R31/02
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