发明名称 |
COMPUTER CONTROL OF PLASMA SEPCTROSCOPE |
摘要 |
<p>A method and apparatus to optimize a characteristic of measured data in an adjustable instrument for chemical analysis. The characteristic is measured at a plurality of adjustment points about a start point. Through parabolic interpolation of the data a conjugate vector is formed and the best operating point thereon is selected. Then measurements of the characteristic are taken as a function of the adjustable parameters about the best point on the conjugate vector. These data are used in a parabolic interpolation to define a second conjugate vector. The best operating point on the second conjugate vector is the optimum point of the instrument.</p> |
申请公布号 |
AU5384486(A) |
申请公布日期 |
1986.08.28 |
申请号 |
AU19860053844 |
申请日期 |
1986.02.20 |
申请人 |
PERKIN-ELMER CORP., THE |
发明人 |
JOHN B. COLLINS;GEORGE E. KISSLAK |
分类号 |
G01N21/73;G01N35/00;G06Q10/04 |
主分类号 |
G01N21/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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