发明名称 COMPUTER CONTROL OF PLASMA SEPCTROSCOPE
摘要 <p>A method and apparatus to optimize a characteristic of measured data in an adjustable instrument for chemical analysis. The characteristic is measured at a plurality of adjustment points about a start point. Through parabolic interpolation of the data a conjugate vector is formed and the best operating point thereon is selected. Then measurements of the characteristic are taken as a function of the adjustable parameters about the best point on the conjugate vector. These data are used in a parabolic interpolation to define a second conjugate vector. The best operating point on the second conjugate vector is the optimum point of the instrument.</p>
申请公布号 AU5384486(A) 申请公布日期 1986.08.28
申请号 AU19860053844 申请日期 1986.02.20
申请人 PERKIN-ELMER CORP., THE 发明人 JOHN B. COLLINS;GEORGE E. KISSLAK
分类号 G01N21/73;G01N35/00;G06Q10/04 主分类号 G01N21/73
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