发明名称 CLEANING OF INTERIOR OF REACTION-TREATMENT DEVICE, PURIFICATION OF GAS-PHASE SUBSTANCE FOR TREATMENT AND REACTION-TREATMENT DEVICE
摘要 PURPOSE:To enable to form a thin film containing very little impurity by a method wherein the interior of a reaction-treating device is cleaned and raw gas for reaction and treatment is purified. CONSTITUTION:The following facts: the major constituent elements of a contaminant and an impurity existing in a reaction-treating device and raw gas for reaction and treatment are carbon (C), oxygen (O), fluorine (F), and nitrogen (N), and these elements can be made to bond with elements easy to oxidize, such as iron (Fe), silicon (Si), zinc (Zn), titanium (Ti), molybdenum (Mo) and tin (Sn): are utilized. The contaminant is decomposed and the C, O, F and N to be formed are made to bond with the above-memtioned elements easy to oxidize and are turned into solid-phase substances. By this way, the interior of the device can be cleansed.
申请公布号 JPS61190943(A) 申请公布日期 1986.08.25
申请号 JP19850030367 申请日期 1985.02.20
申请人 HITACHI LTD 发明人 MURAMATSU SHINICHI;KOKUUCHI SHIGERU
分类号 H01L21/205;H01L21/22;H01L21/302;H01L21/3065;H01L21/324 主分类号 H01L21/205
代理机构 代理人
主权项
地址