| 摘要 |
PURPOSE:To detect surely the factor of a fault of a semiconductor device at an initial device examination as well to be carried out prior to a delivery by allowing an output side of an output control circuit to turn out a high impedance when a detecting temperature in the vicinity of an output control circuit exceeds a specified value. CONSTITUTION:The output of a chip temperature detector 2 which is provided in the vicinity of the output control circuit 1 producing three kinds of outputting states reverses to L, when chips' detecting temperature exceeds the specified value and the output of AND gate 16 comes out L. As a result, the output of the AND gates 12 and 13 turns out L regardless of the output from a sense amplifier and then transistors 14 and 15 turn out OFF to allow the output side of the circuit 1 to be a high impedance. Thus this state renders a readout unable and the faults occurred in semiconductor are surely detected by the initial examination as well perform prior to the delivery.
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