发明名称 WIRING FORMING METHOD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form wirings of high reliability by forming a double layer made of polysilicon of lower layer and metal of upper layer to become a wiring layer on a substrate, and patterning the metal by an isotropic etching and polysilicon an anisotropic etching. CONSTITUTION:A substrate 4 in which a contacting hole is opened is prepared at the desired position. Then, a double layer made of polysilicon of lower layer 5b and aluminum or aluminum alloy of upper layer 5a to become a wiring layer 5 is formed on the substrate 4. A patterning for wiring is then performed, the aluminum or aluminum alloy of the layer 5a not placed with a photoresist film is then isotropically etched by phosphoric acid, and the polysilicon of layer 5a of the position not placed with a photoresist film is anisotropically etched. Thereafter, the photoresist film is removed, and after the patterning is finished, a protective insulating film 3 is formed by a CVD method and the like.
申请公布号 JPS61188947(A) 申请公布日期 1986.08.22
申请号 JP19850028426 申请日期 1985.02.18
申请人 SUMITOMO ELECTRIC IND LTD 发明人 HORI MINORU;IDA JIRO
分类号 H01L21/3205;H01L21/302;H01L21/3065 主分类号 H01L21/3205
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