发明名称 SPECIMEN STAND FOR X-RAY DIFFRACTION
摘要 PURPOSE:To enable the accurate identification and analysis of a polycrystalline powdery substance having strong cleavability or a membrane substance having large degree of orientation, by mounting a mechanism for allowing a support to apply precession to a specimen holder. CONSTITUTION:The titled specimen stand is constituted of a specimen holder for filling a specimen and a support connected to said specimen holder and imparting precession thereto. This specimen stand has a fixed point O as an apex and performs precession around a straight line OO' at a precession angle theta. The magnitude of the angle alpha is arbitrarily determined corresponding to the degree of cleavability or degree of orientation but sufficient in a range of 10-30 deg. in usual. As the result of this precession, a crystal surface suppressed by cleavability or degree of orientation is markedly restored in a chance satisfying a Bragg diffraction condition and the deviation of relative diffraction intensity distribution is prevented. Therefore, the accurate identification and analysis of a membrane substance can be performed.
申请公布号 JPS61187639(A) 申请公布日期 1986.08.21
申请号 JP19850027858 申请日期 1985.02.15
申请人 NEC CORP 发明人 KAWAMURA TSUTOMU
分类号 G01N23/20;(IPC1-7):G01N23/20 主分类号 G01N23/20
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