| 摘要 |
PURPOSE:To make quantitative analysis with good accuracy by setting a tentative measured value from the primary measured values of other elements when there is an element of which the primary measured value cannot be determined then correcting the same in the stage of calculating the concn. of each element from the intensity of characteristic X-rays. CONSTITUTION:The component elements of the sample are assumed to be A, B,-M, N and the primary measured values of the respective elements as Ka, Kb,-Km. The element N is assumed to be the element of which the primary measured value cannot be determined. The primary measured value K'n of the element N is tentatively determined by formula I. The correction factor G'n of the element N is calculated by the prescribed ZAF method derived from an electron ray excitation effect, etc. by the atomic number of the elements using the measured values Ka, Kb,-Km, K'n. The primary measured value Kn of the element N is then determined by formula II. The correction factors Ga, Gb,-Gm, Gn of the respective elements are determined by the primary measured value of the respective elements. The concns. Ca, Cb,-Cm, Cn of the elements are determined by formula III. The quantitative analysis of the element with good accuracy is made possible by the value corresponding to the primary measured value of the element even if there is no standard sample and the element of which the primary measured value cannot be determined is included in the sample. |
