发明名称 DICING METHOD FOR SEMICONDUCTOR WAFER
摘要 <p>PURPOSE:To dice an silicon wafer with high precision by bonding and fixing the semiconductor wafer to a dicing film by comparatively strong adhesive force, diving the wafer and reducing the adhesive force of the dicing film. CONSTITUTION:A semiconductor wafer is placed, bonded and fixed onto a dicing film, in which the layer of a pressure-sensitive adhesive composition containing an acrylic group adhesive mass and an ultraviolet cross-linking acrylic acid ester is formed onto a base material sheet through which ultraviolet rays can be transmitted, and diced, ultraviolet rays are projected from the back of the dicing film, the adhesive force of a pressure-sensitive adhesive is reduced, and a dice is picked up. Acrylic group adhesive mass itself used in the pressure-sensitive adhesive composition substantially consists of an acrylic acid ester copolymer. Ultraviolet cross-linking acrylic acid ester represents acrylic acid ester or methacrylic acid ester as an oligomer or a monomer cross- linked by the irradiation of ultraviolet rays, and has at least two acryloyl groups or methacryloyl groups in a molecule.</p>
申请公布号 JPS61187248(A) 申请公布日期 1986.08.20
申请号 JP19850028031 申请日期 1985.02.14
申请人 BANDO CHEM IND LTD 发明人 KURODA HIDEO;TANIGUCHI MASAO
分类号 H01L21/301;C09J7/02;H01L21/68;H01L21/78 主分类号 H01L21/301
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