发明名称 X-ray examining device.
摘要 <p>An X-ray examining device in accordance with the invention includes an X-ray source, an object carrier, an X-ray detector and a curved stray radiation grid which is arranged between the object carrier and an entrance window of the X-ray detector. In order to obtain images at different irradiation angles, rotation of X-ray source and X-ray detector about, for example a patient to be examined is necessary. In inclined positions of the X-ray detector, however, imaging is not optimum because the distance between the X-ray source and the entrance screen of the X-ray detector must be increased because of the customary flat shape of the stray radiation grid. Moreover, the stray radiation grid will also absorp a comparatively large amount of X-rays when the X-ray detector is not ideally positioned. These drawbacks are eliminated when use is made of a stray radiation grid in which either the direction of curvature is identical or opposed to that of the curvature of the entrance window of the X-ray detector, or the direction of curvature is identical to that of the curvature of the object carrier.</p>
申请公布号 EP0191532(A1) 申请公布日期 1986.08.20
申请号 EP19860200179 申请日期 1986.02.10
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 VAN DER LAAKEN, MAARTEN;DEN BOER, JACOB ANNE
分类号 H04N5/32;A61B6/00;G01N23/04;G03B42/02;G21K1/02;H05G1/64;(IPC1-7):G21K1/02;G01T1/164 主分类号 H04N5/32
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