发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To enable to perform microscopic work on an electrode and a wiring using a wet etching method at low cost with good productivity by a method wherein, after a thin film to be made into an electrode and a wiring pattern has been formed, a semiconductor substrate is dipped into an organic solvent or exposed to the atmosphere of the organic solvent, and then the thin film is dried up by heating. CONSTITUTION:A thin film 3 is formed on the insulating film 2 of SiO2 and the like provided on a semiconductor substrate 1, a positive type resist is coated on the thin film 3, and a positive type resist pattern 4 is formed by performing a series of photolithographic processes such as mask matching, exposure, developing and the like. At this time, innumerable traces of broken-out gas generated by optical reaction or thermal decomposition of the composition of the resist pattern 4 are left between the resist pattern 4 and the thin film 3 as air gaps 5, 5.... Then, the treatment such as dipping the above-mentioned material into an organic solvent or exposing it to the atmosphere of said solvent and the like is performed. Subsequently, a heat drying process is performed, the resist pattern 4 is sufficiently deformed by the heat of said drying process, and the air gaps 5, 5... are filled up.
申请公布号 JPS61185924(A) 申请公布日期 1986.08.19
申请号 JP19850027330 申请日期 1985.02.13
申请人 SHARP CORP 发明人 YAMAMOTO IKUO
分类号 H01L21/30;H01L21/027;H01L21/28;H01L21/306 主分类号 H01L21/30
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