| 摘要 |
<p>An arrangement for the measurement of electronic units with a large number of connection points situated close to one another and constituting points of measurement, as in integrated circuits. The arrangement comprises a measuring device (1) with at least one fastening member by means of which the arrangement is secured to the electronic unit in a specific, fixed position. Spring-loaded contact elements (2) provided on the measuring device are so arranged as to come into electrical contact with measurement points on the electronic unit. The positioning of the contact elements on the measuring device forms a pre-determined pattern which matches directly the measurement points on the electronic unit. The fastening member is provided with a recess. The aforementioned recess is connected, via a preferably elongated, tubular and flexible element (19), to an air suction arrangement. The aforementioned electronic unit can be secured in the recess by means of negative pressure which is produced by means of the air suction arrangement when the electronic unit is fitted into the recess. The spring-loaded contact elements (2) are in electrical contact, preferably via an adapter circuit, with measurement instruments which may be of a previously disclosed type.</p> |
