发明名称 |
Method of manufacturing a thyristor. |
摘要 |
<p>Disclosed is a method of manufacturing a thyristor having a base layer comprising impurity layers which are bonded to each other, comprising the steps of bringing a first semiconductor substrate (11) having a first impurity layer (12) whose surface is mirror-polished into contact with a second semiconductor substrate (13) whose surface is mirror-polished and which is of the same conductivity type as the first impurity layer (12), so that the mirror-polished surfaces are in contact with each other, and in a pure atmosphere so that virtually no foreign substances are present therebetween, and annealing the first and second semiconductor substrates whose mirror-polished surfaces are in contact with each other at a temperature of not less than 200 DEG C so as to bond the mirror-polished surfaces together, thereby forming the base layer consisting of the impurity layer and the second semiconductor substrate.</p> |
申请公布号 |
EP0190934(A2) |
申请公布日期 |
1986.08.13 |
申请号 |
EP19860300819 |
申请日期 |
1986.02.06 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
OGURA, TSUNEO C/O PATENT DIVISION;OHASHI, HIROMICHI C/O PATENT DIVISION;NAKAGAWA, AKIO C/O PATENT DIVISION;SHIMBO, MASARU C/O PATENT DIVISION |
分类号 |
H01L29/74;H01L21/18;H01L21/306;H01L29/10;H01L29/36;H01L29/744;(IPC1-7):H01L21/20;H01L21/302;H01L29/743 |
主分类号 |
H01L29/74 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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