发明名称 TREATING DEVICE FOR RESIST
摘要 PURPOSE:To uniformize the temperature of a substrate and to stabilize the sensitivity of the resist by a method wherein the baking chamber and the cooling chamber are partitioned by the shutter and the cooling mechanism to receive the substrate is provided at a position lower than the heating plate in the baking chamber. CONSTITUTION:The substrate is conveyed by a walking beam 1 consisting of a pair of beam-form rails. The baking chamber and the cooling chamber are provided midway of the walking beam 1. The baking chamber and the cooling chamber are portioned by a heat insulating plate 2 and a shutter 3. Heating units 5 and a heating plate 6 are respectively provided on the upper side and the lower side in the baking chamber. On the other hand, a cooling mechanism 7 to receive the substrate is provided at a position lower than the heating plate 6 on the lower side of the beam 1 in the walking chamber. The substrate in after being baked is brought into close contact to a temperature control plate 8 by heat insulating pins and is cooled.
申请公布号 JPS61180438(A) 申请公布日期 1986.08.13
申请号 JP19850021064 申请日期 1985.02.06
申请人 TOSHIBA CORP 发明人 TSUCHIYA NOBUJI;MATSUOKA YASUO
分类号 H01L21/027;G03F7/26;H01L21/30;(IPC1-7):H01L21/30 主分类号 H01L21/027
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