发明名称 |
TREATING DEVICE FOR RESIST |
摘要 |
PURPOSE:To uniformize the temperature of a substrate and to stabilize the sensitivity of the resist by a method wherein the baking chamber and the cooling chamber are partitioned by the shutter and the cooling mechanism to receive the substrate is provided at a position lower than the heating plate in the baking chamber. CONSTITUTION:The substrate is conveyed by a walking beam 1 consisting of a pair of beam-form rails. The baking chamber and the cooling chamber are provided midway of the walking beam 1. The baking chamber and the cooling chamber are portioned by a heat insulating plate 2 and a shutter 3. Heating units 5 and a heating plate 6 are respectively provided on the upper side and the lower side in the baking chamber. On the other hand, a cooling mechanism 7 to receive the substrate is provided at a position lower than the heating plate 6 on the lower side of the beam 1 in the walking chamber. The substrate in after being baked is brought into close contact to a temperature control plate 8 by heat insulating pins and is cooled. |
申请公布号 |
JPS61180438(A) |
申请公布日期 |
1986.08.13 |
申请号 |
JP19850021064 |
申请日期 |
1985.02.06 |
申请人 |
TOSHIBA CORP |
发明人 |
TSUCHIYA NOBUJI;MATSUOKA YASUO |
分类号 |
H01L21/027;G03F7/26;H01L21/30;(IPC1-7):H01L21/30 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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