发明名称 TEST CONNECTION SYSTEM FOR SUBSCRIBER CIRCUIT
摘要 PURPOSE:To promote the size reduction of a subscriber circuit package by providing a test arrester spring to the channel of a subscriber circuit, and inserting a test plug into the arrester spring and connecting at least either a corresponding subscriber circuit or a subscriber line to a testing circuit. CONSTITUTION:When a testing operator inserts the test plug 7 into the arrester spring 36, contact springs 37a and 38a and contact springs 37b and 38b leave each other and an internal circuit 32 is disconnected from a subscriber line 2, etc. The test plug 7, on the other hand, is provided with contact conductor pieces 71a and 71b connected to a testing circuit 4 through a test channel 61 and contact conductor pieces 72a and 72b connected to a testing circuit 5 through a test channel 61 and plug is inserted into the arrester spring 36, so that it contacts the contact springs 37a and 37b or 38a and 38b respectively. Consequently, the internal circuit 32 is connected to the testing circuit 4 through channels 31a and 31b, contact springs 37a and 37b, and contact conductor pieces and test channel 61, and the subscriber line 2, etc., are connected to the test circuit 5 through the contact springs 38a and 38b, contact conductor pieces, and test channel 62.
申请公布号 JPS61173563(A) 申请公布日期 1986.08.05
申请号 JP19850014718 申请日期 1985.01.29
申请人 FUJITSU LTD 发明人 TOJO TOSHIRO;IKETANI YOZO;AYANO MITSUTOSHI;SHIBUYA KIYOSHI;ITO SHINICHI
分类号 H04M3/30;(IPC1-7):H04M3/30 主分类号 H04M3/30
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