| 摘要 |
PURPOSE:To measure accurately organic paint coated film thickness, by performing element correcting calculation based upon a multi-recursive process in response to a point coated film thickness signal obtained from an infrared ray type coated film thickness measuring device. CONSTITUTION:Beams of light reflected, absorbed and dissipated by metallic particles 4 included in a coated film 1' of a specimen are checked by a reflected light quantity detector 6 and an output signal converted to an electric one here is introduced into a signal processor 7. An electric signal of the light quantity by the processor 7 is converted to a coated film thickness. At this moment, from an element value holder 8 in which an element value per each kind is set previously by kind and quantity of metallic particles in the coated film, a signal is fed into a calculating apparatus 9 and based upon this output signal, the apparatus 9 obtains correcting coefficient and element ratio and by this correcting coefficient and element ratio, and by this correcting coefficient and element ratio, an element correcting calculating process is performed, based on a multi-vecursive process, on the coated film thickness signal obtained by a film thickness meter of infrared ray type. |
