发明名称 Environmental chamber
摘要 An environmental chamber for testing objects, such as electronic components under climatic conditions, in the range of 80 DEG C. to 150 DEG C. and relative humidities in the range of 70% to 95%. The test chamber is pressurized and supplied with moisturized, heated air to obtain the desired climatic condition, the climatic condition being maintained by surrounding the test chamber with an insulated housing. A double door arrangement is provided to effect a pressure seal and for isolation of the test chamber from any appreciable heat loss.
申请公布号 US4602503(A) 申请公布日期 1986.07.29
申请号 US19850753922 申请日期 1985.07.11
申请人 PARAMETER GENERATION & CONTROL, INC. 发明人 HILE, JOHN R.;HILE, W. ROSS
分类号 G01R31/28;(IPC1-7):G01F15/14 主分类号 G01R31/28
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