发明名称 TEST DATA GATHERING ANALYZER
摘要 PURPOSE:To gather data in a high-speed scanning cycle by using an input device which can input data directly to a buffer where several scan data can be stored and changing the wire address of the buffer in the input device, an interrupt generation table, and a timer before data gathering is started when test conditions are satisfied. CONSTITUTION:An interrupt generation address for gathering is calculated in accordance with the scanning cycle for gathering which is set while a monitor means 4 is operated before gathering of test data, and this address is set to a table 20 to prepare for test. When test conditions are satisfied, a buffer initializing means 21 refers to the interrupt generation table 20 for gathering to change a write address 15 to the start address of a buffer following a current input buffer, and an interrupt generation table changing means 22 started by the buffer initializing means 21 changes contents of an interrupt generation table 16 indicating the address where a input device 2 generates an interrupt, and the input of data due to the scanning cycle for gathering is started, and data is gathered when the interrupt of one buffer full is generated.
申请公布号 JPS61168021(A) 申请公布日期 1986.07.29
申请号 JP19850007487 申请日期 1985.01.21
申请人 TOSHIBA CORP 发明人 HOSOI HIROKO
分类号 G21C17/00;G05B23/02;G06Q50/00;G06Q50/10 主分类号 G21C17/00
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