发明名称 INSTRUMENT FOR ANALYZING COMPOSITION OF OBJECT TO BE MEASURED BY RADIATION
摘要 PURPOSE:To make possible the analysis of the compsn. and outside shape of an object to be measured with high accuracy by making the optical axes of radiation and laser light coincident with each other and irradiating the same to the object to be irradiated in such a manner that the radiation transmits the object and that the laser light is shielded by said object. CONSTITUTION:White X-rays are irradiated through collimators 3, 5 from a white X-ray source 2 to the object 7 to be measured and the white X-rays transmitted therethrough are made incident through a collimator 6 on a radiation detector 4 by which the compsn. of the object to be measured is analyzed. The laser light from a laser light source 6 is made incident on the 1st reflector 10 on the optical axis L of the white X-rays by which the laser light is so reflected as to be aligned to the optical axis L. The 2nd reflector 11 is provided on the optical axis L on the rear side of the object 7 to reflect the laser light and to make incident the reflected light on a laser light detector 9. The white X-rays transmit the object 7 but the laser light is shielded by said object when the object 7 is moved in the direction perpendicular to the optical axis L and therefore both end edges of the object are detected. The analysis of the compsn., width, outside diameter, etc. of the object with high accuracy is thus made possible.
申请公布号 JPS61167844(A) 申请公布日期 1986.07.29
申请号 JP19850008724 申请日期 1985.01.21
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 KOMURA YUKIO;MASUKATA YOSHIMASA;ABE FUMIHIKO;KOAIZAWA HISASHI
分类号 G01M11/00;G01N23/06 主分类号 G01M11/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利