| 摘要 |
A circuit arrangement for use in an integrated circuit having a built-in self test design, the circuit arrangement comprising first and second gates coupled to a flip-flop via a third gate. The present invention provides a multiplexer coupled to one input of the first gate, the multiplexer being controllable by a control signal to feed either input data or output data of the circuit arrangement to said one input of the first gate and a fourth gate coupled to an input of the second gate, the fourth gate having an input connected to receive a signal dependent on the control signal to the data selector means. |
