发明名称 REACTIVE ION ETCHING APPARATUS
摘要 PURPOSE:To perform the reactive ion etching having three-dimensional anisotropy by taking out the reactive neutral molecule flow generated in the inside of a subdischarge chamber and introducing it into a main chamber of a high-vacuum side in the optical incident direction. CONSTITUTION:In the inside of a main chamber 1 wherein the reactive gas is introduced through an introduction port 8 to make the high vacuum and a grounded wall 5 is made to an electrode opposing to a target, the material 10 to be etched is provided via a target material 14 on a negative electrode 13 and the reactive ions generated from the target material 14 are accelerated by the electric field of an ionic sheath 16 and the above-mentioned material 10 is vertically etched on the surface. Together with this, in the inside of a subdischarge chamber 2 wherein the reactive gas is introduced through an introduction port 7 and the pressure is higher than the main chamber 1, the neutral molecule generated by making the above-mentioned electrode 5 a common electrode and colliding the reactive ion accelerated by a plasma sheath 15 against a target material 3 on a negative electrode 4 is introduced into the main chamber 1 via an introduction pipe 17 after the ions are filtered through the mesh electrodes 6, 18 and thereby the material 10 is etched in the optical incident angle.
申请公布号 JPS61163287(A) 申请公布日期 1986.07.23
申请号 JP19850002386 申请日期 1985.01.10
申请人 NEC CORP 发明人 MORI KATSUMI;ASATA SUSUMU;MATSUI SHINJI
分类号 C23F4/00;C23F1/08;H01L21/302 主分类号 C23F4/00
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