发明名称 BONDING WIRE FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain a bonding wire for a semiconductor device having high tensile strength at high temp. and superior thermal fatigue resistance by adding a specified amount of Be to Al. CONSTITUTION:A bonding wire for a semiconductor device is manufactured by adding 0.1-1.5wt% Be to Al. The grains of a precipitated phase is required to be regulated to <=about 0.3mum grain size and to be dispersed at <=about 1mum interval so as to inhibit recrystallization. In order to form such grains, annealing is preferably carried out at about 400-600 deg.C in case of 1hr annealing time.
申请公布号 JPS61163230(A) 申请公布日期 1986.07.23
申请号 JP19850000802 申请日期 1985.01.09
申请人 TOSHIBA CORP 发明人 SATO MICHIO;MIYAUCHI MASAMI
分类号 C22C21/00;H01L21/60;H01L23/495 主分类号 C22C21/00
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