发明名称 |
BONDING WIRE FOR SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To obtain a bonding wire for a semiconductor device having high tensile strength at high temp. and superior thermal fatigue resistance by adding a specified amount of Be to Al. CONSTITUTION:A bonding wire for a semiconductor device is manufactured by adding 0.1-1.5wt% Be to Al. The grains of a precipitated phase is required to be regulated to <=about 0.3mum grain size and to be dispersed at <=about 1mum interval so as to inhibit recrystallization. In order to form such grains, annealing is preferably carried out at about 400-600 deg.C in case of 1hr annealing time. |
申请公布号 |
JPS61163230(A) |
申请公布日期 |
1986.07.23 |
申请号 |
JP19850000802 |
申请日期 |
1985.01.09 |
申请人 |
TOSHIBA CORP |
发明人 |
SATO MICHIO;MIYAUCHI MASAMI |
分类号 |
C22C21/00;H01L21/60;H01L23/495 |
主分类号 |
C22C21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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