ABSORBENT BODY WITH SEMIPERMEABLE MEMBRANE,申请号EP19820903495-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	ABSORBENT BODY WITH SEMIPERMEABLE MEMBRANE
摘要
申请公布号	EP0108063(B1)	申请公布日期	1986.07.23
申请号	EP19820903495	申请日期	1982.11.25
申请人	KAMME, CARL GUSTAF	发明人	KAMME, CARL GUSTAF
分类号	A61F13/00;A61F13/15;A61L15/26;A61L15/28;A61L15/60;(IPC1-7):A61F13/18	主分类号	A61F13/00
代理机构		代理人
主权项
地址

您可能感兴趣的专利

AUTOMATION METHOD OF POSITION APPOINTMENT BY PARSING OF INPUT INFORMATION

IMAGING APPARATUS WITH COMMUNICATION FUNCTION, IMAGE DATA STORING METHOD AND COMPUTER PROGRAM

A NEW METHOD TO OFFER MOBILE CONTENTS IN INTERNET

HOW TO RUN AND HOW TO GET A PROFIT FROM A WEBSITE WHICH ENABLES PEOPLE TO BET ON VARIOUS ISSUES

A WATER TURNING METHOD OF POWERLESS DRAIN PIPE AND APPARATUS THEREOF

METHOD FOR MANUFACTURING A SANITARY TOILET USING A VINYL SHEET, INSTALLING A COUNTER ROLLER WITH REGULAR DIAMETER AND A DETACHING DISC INTERLOCKED WITH THE COUNTER ROLLER, AT A LOWER PART OF A RETURNING ROLLER

PAN CAKE COOKING DEVICE

A MEDICINES COMPOUNDER

CENTRAL CONTROL SYSTEM FOR REMOTE CONTROL OF THE PUBLIC BUILDING USING INTERNET

FIRE-RETARDANT COATING, METHOD FOR PRODUCING FIRE-RETARDANT BUILDING MATERIALS

PREFORM ASSEMBLY, CONTAINER ASSEMBLY, AND METHOD OF MANUFACTURE

Motor vehicle folding exterior mirror has folding mechanism that folds the mirror in so that its outer mirror surface is closely aligned with the surface of a side window

Verfahren und Vorrichtung zum Vermessen eines Oberflächenprofils einer Probe

Filling/charge monitoring process for a cooking device comprises analyzing a characteristic parameter for a ventilation device that changes on the basis of the force exerted by a fluid incident on a fan using a filling/charge

Vorrichtung und Verfahren zum Bestimmen einer Tonart eines Audiosignals mit Musikinformationen

Aufhänger für Bohrer

Tastatur-Video-Maus-Schalter für mehrfache Kettung und Verfahren zum Schalten elektrischer Signale davon

ALUMINA-BASED CERAMIC MATERIAL AND PRODUCTION METHOD THEREOF

METHOD AND STRUCTURE FOR A TEST PROGRAM FOR SEMICONDUCTOR INTEGREATED CIRCUITS