发明名称 Electron beam intensity profile measuring system and method
摘要 A system for measuring the intensity profiles of the electron beams of color kinescopes includes a camera having a CCD. A color field is placed on the kinescope screen and a pixel in the center of one of the colored stripes is selected. The color field is turned off and the beam is scanned in short lines in one direction and incrementally stepped across the selected pixel in the perpendicular direction. The charge level on the selected pixel is representative of the beam intensity and is recorded. The entire beam is stepped across the pixel to measure the intensity profile in one direction. The directions of scanning and stepping are then interchanged to measure the beam intensity profile in the normal direction. The process is then repeated for the other electron beams in the kinescope.
申请公布号 US4602272(A) 申请公布日期 1986.07.22
申请号 US19840670605 申请日期 1984.11.13
申请人 RCA CORPORATION 发明人 DUSCHL, ROBERT A.
分类号 H04N17/04;(IPC1-7):H04N17/02 主分类号 H04N17/04
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