发明名称 Method of producing a thin silicon-on-insulator layer
摘要 A method of forming a thin silicon layer upon which semiconductor devices may be constructed. An epitaxial layer is grown on a silicon substrate, and oxygen or nitrogen ions are implanted into the epitaxial layer in order to form a buried etch-stop layer therein. An oxide layer is grown on the epitaxial layer, and is used to form a bond to a mechanical support wafer. The silicon substrate is removed using grinding and/or HNA, the upper portions of the epitaxy are removed using EDP, EPP or KOH, and the etch-stop is removed using a non-selective etch. The remaining portions of the epitaxy forms the thin silicon layer. Due to the uniformity of the implanted ions, the thin silicon layer has a very uniform thickness.
申请公布号 US4601779(A) 申请公布日期 1986.07.22
申请号 US19850747746 申请日期 1985.06.24
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ABERNATHEY, JOHN R.;LASKY, JEROME B.;NESBIT, LARRY A.;SEDGWICK, THOMAS O.;STIFFLER, SCOTT, R.
分类号 H01L21/02;H01L21/20;H01L21/265;H01L21/316;H01L21/84;H01L27/12;(IPC1-7):H01L21/306;B44C1/22;C03C15/00;C03C25/06 主分类号 H01L21/02
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