发明名称 SELF-DIAGNOZING CIRCUIT OF ELECTRONIC EQUIPMENT
摘要 PURPOSE:To grasp easily the state of a trouble within a period by storing data in a previously set-up period and data for the frequency of the generation of the trouble which is previously set up by contents of individual troubles, and when a trouble is generated, reading out the data for the frequency of generation of the corresponding trouble and the data for the set frequency from a trouble collecting table to compare both the data. CONSTITUTION:A data bus 2, a ROM16, a timer circuit 17, and a RAM18 are connected to a CPU1. An operation program of the CPU1 is stored in the ROM16. A timer circuit 17 applies a time interval signal for checking the paper passing time of each sensor to the CPU1. the RAM18 includes a storage area for storing the trouble collecting table. The data for the set frequency of generation of a trouble in individual maintenance codes within a previously set-up period or the data for the set ratio of a trouble and the accumulated frequency of the generated trouble are stored in the trouble collecting table 180. When the frequency of the generated trouble in individual maintenance codes within the set period exceeds the previously set frequency or set ratio, the corresponding trouble generating position is displayed by display lamp.
申请公布号 JPS61160151(A) 申请公布日期 1986.07.19
申请号 JP19840280546 申请日期 1984.12.29
申请人 OMRON TATEISI ELECTRONICS CO 发明人 FUJIHIRA YOSHIYUKI
分类号 G06F11/22 主分类号 G06F11/22
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