发明名称 APPARATUS FOR DIAGNOSING RESIDUAL LIFE OF STRUCTURE
摘要 PURPOSE:To estimate the residual life of a structure with high accuracy by detecting the number, size and distribution state of damage, by detecting the state of damage while moving a detection part along the surface of the structure through a scanning apparatus and applying operational processing to the detection signal. CONSTITUTION:When a housing 9 is evacuated through a vacuum exhaust pipe 8 and a vacuum apparatus 16, said housing 9 is urged to an article 1 to be measured through bellows 11 and the elastomer provided to the leading end of said bellows 11 and a TV camera 3 and a lens system 2 are moved along the surface of the article 1 to be measured by an X-Y drive apparatus 5 and the image of the damage on the surface thereof is picked up. The image signal is stored in memory 14 through MPU13. MPU13 reads the image signal from the memory 14 to apply operational processing thereto and the result thereof is displayed on a display apparatus 15. By this method, surface damages having various sizes are acculately detected and the residual life of the structure is estimated with high accuracy.
申请公布号 JPS61160037(A) 申请公布日期 1986.07.19
申请号 JP19850000838 申请日期 1985.01.09
申请人 HITACHI LTD 发明人 UMEZAWA SADAO;SAKURAI SHIGEO;MIYATA HIROSHI;TORITANI HAJIME
分类号 G01N3/32;G01M99/00;G01N3/00;G01N21/84;G01N21/88 主分类号 G01N3/32
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