发明名称 TEMPERATURE MONITORING APPARATUS
摘要 PURPOSE:To make it possible to measure temp. with high accuracy even when the optical characteristics of an object are unknown, by operating surface temp. after calculating the radiation ratio showing the surface state of the object by using a light source comprising a plurality of wavelengths. CONSTITUTION:Two light beams having different wavelengths are allowed to irradiate an object 1 from a light source 2 and the reflected light and radiant rays are received by an infrared TV camera 3. To lights with wavelengths lambda1, lambda2, Af2(T)-Bf1(T)=Af2(Ts)-Bf1(Ts) and A=[E1-f1(Rs)]g(lambda2), B=[E2-f2f2(Ts)]g(lambda1) are formed and the surface temp. T of the object can be calculated by an operation circuit 4. By this method, the monitoring and inspection of various objects can be performed efficiently and certainly.
申请公布号 JPS61160028(A) 申请公布日期 1986.07.19
申请号 JP19850000235 申请日期 1985.01.07
申请人 HITACHI LTD 发明人 SUGIYAMA SAKAE;SENOO MAKOTO
分类号 G01J5/00;G01J5/60;G01K11/12 主分类号 G01J5/00
代理机构 代理人
主权项
地址