发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent transfer failure of a pattern by providing a trench between circuit areas, producing a film to be etched, applying a resist, closely contacting a mask, and performing an exposure phenomenon. CONSTITUTION:The main surface 1b of a GaAs substrate constituting a circuit forming area is divided by an etching trench 1a, and a positive resist 2 is rotationally applied. A mask 3 of a pattern 3a is closely contacted. A film 4 is a film to be etched such as SiO2, and is coated over the whole GaAs substrate before the trench 1a is performed. When the mask 3 is closely contacted with the positive resist 2, air between these escapes into the recess of th resist 2 on the trench 1a, so that transfer failure due to the residual air is dissolved. Further, the entire trench can be utilized as a scribe line, and breakage is reduced at the time of dividing.
申请公布号 JPS61156734(A) 申请公布日期 1986.07.16
申请号 JP19840274533 申请日期 1984.12.28
申请人 FUJITSU LTD 发明人 KIYONO TSUTOMU
分类号 G03F7/20;H01L21/027;H01L21/30 主分类号 G03F7/20
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