发明名称 METHOD AND APPARATUS FOR MEASURING THE ILLUMINATION UNIFORMITY IN A RING FIELD PROJECTION SYSTEM
摘要 This invention relates to a method and apparatus for measuring the exposure variation in the cross scan direction in an optical projector and scanning apparatus of the type that uses an annular aperture or slit. This measuring is achieved by measuring the light intensity from point to point along the arcuate illuminated area. Where the illuminated area is tapered so as to accommodate a pivoting carriage the system of this invention processes the intensity signal to yield a uniformity signal that only indicates departures from the ideal.
申请公布号 DE3271539(D1) 申请公布日期 1986.07.10
申请号 DE19823271539 申请日期 1982.07.16
申请人 THE PERKIN-ELMER CORPORATION 发明人 LIU, RAYMOND C.;MARKLE, DAVID A.
分类号 G03B27/02;G01J1/42;G01J1/44;G03F7/20;H01L21/027;H01L21/30;(IPC1-7):G03B41/00 主分类号 G03B27/02
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