发明名称 |
X-ray diagnostic apparatus |
摘要 |
An X-ray diagnostic apparatus comprises an X-ray radiation source for generating an X-ray and projecting the same toward an object, an X-ray detector for detecting the X-ray which has transmitted through the object to derive a total X-ray intensity distribution signal of the object including a primary X-ray signal component and a scattered X-ray signal component caused by scattered X-rays and system structural factors, a signal processor which processes the X-ray intensity distribution signal detected from the X-ray detector in such a manner that a scattered X-ray intensity distribution which is pre-calculated based upon the X-ray intensity distribution signal is eliminated from an X-ray intensity distribution obtained from the X-ray intensity distribution signal so as to derive a distribution function of the primary X-ray signal component without adverse influences on the scattered X-ray signal component, and a monitor for displaying a distribution form based upon the distribution function of the primary X-ray signal component.
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申请公布号 |
US4599742(A) |
申请公布日期 |
1986.07.08 |
申请号 |
US19840581043 |
申请日期 |
1984.02.17 |
申请人 |
TOKYO SHIBAURA DENKI KABUSHIKI KAISHA |
发明人 |
KIKUCHI, KATSUYA;HONDA, MICHITAKA |
分类号 |
G01N23/04;A61B6/00;H04N5/32;(IPC1-7):H04N7/18 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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