发明名称 MANUFACTURE OF SILICON CARBIDE SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To enable short-time production by dry etching in carbon tetrafluoride gas or a gas containing carbon tetrafluoride gas, etching in a heated salt solution, and forming a Schottky electrode on the Si carbide semiconductor substrate surface. CONSTITUTION:An Si carbide single crystal layer 2 is formed on a P-type Si substrate 1. Next, the surface layer is removed by plasma-etching this single crystal wafer in the gas plasma of a mixed gas of carbon tetrafluoride gas with oxygen gas. Further, the whole is etched in a 20% heated solution of potassium carbonate. Nickel is evaporated to the removal surface and heat- treated into an ohmic electrode 3; thereafter, a Schottky diode is produced by evaporating e.g. Au as the Schottky electrode 4.
申请公布号 JPS61150272(A) 申请公布日期 1986.07.08
申请号 JP19840275670 申请日期 1984.12.24
申请人 SHARP CORP 发明人 SUZUKI AKIRA;FURUKAWA MASAKI;SHIGETA MITSUHIRO
分类号 H01L29/812;H01L21/28;H01L21/338;H01L29/47;H01L29/861;H01L29/872 主分类号 H01L29/812
代理机构 代理人
主权项
地址