Test probe assembly for IC chips

摘要

A test probe assembly for checking an integrated circuit chip before terminal leads are applied to the contacts thereof which are deployed on the chip in a common plane. The assembly includes a planar insulation card provided with a port and having a printed circuit thereon whose traces are connected to a plurality of test terminals connectable to external testing equipment. Surrounding the port and bonded to the card is a mounting ring of dielectric material having a flat face on which is supported a radial array of fine wires lying in a horizontal plane. These are maintained in their assigned positions by a layer of dielectric material adherent to the face, the wires being embedded in the layer. The wires cantilever across the port and converge toward the central region thereof below which is disposed the chip to be tested, the tapered leading end of each wire being double bent to define a needle having a shank section and a tip section terminating in a tip which engages a respective contact on the chip. The tip section has a downward slope whereby the tips of the needles are exposed to view through a microscope for purposes of alignment. The trailing end of each wire is soldered to a respective trace connecting each needle to a test terminal.