| 摘要 |
A test probe for determining the logic state of a digital logic circuit, which probe utilizes threshold detectors to determine the relative voltage level of a test point, and gate circuits to enable various voltage conditions, e.g., a ground, high, low, uncommitted, or a supply voltage, or a random pulse or a pulse train, to be be monitored and the test result indicated on an LED alpha display device. The threshold detectors are selectively settable so that the probe is particularly adapted to test TTL and CMOS circuitry.
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