发明名称 FLAW DETECTING DEVICE
摘要 PURPOSE:To take an analysis about whether there is a flaw or not after inspection and to shorten the time of the analysis by reading whether there is a flow or not, the position of the flaw, and its degree on a display device in real time. CONSTITUTION:The quantity of variation in the impedance or induced voltage of an object body 2a detected by inspection coils 2 and 3 for measurement and comparison is detected by a tester body 1b by utilizing a multiple frequency and inputted to an arithmetic device 5 through an A/D converter 4 and an I/O device 5a. This input signal is processed by the device 5, whose arithmetic result is compared with specific reference data and analyzed to decide whether there is a flaw in the object body 2a or not, the position of the flaw, its size, etc., thereby displaying the arithmetic ersult and comparative analysis result on a plotter, printer, and CRT in real time through an I/O device 50.
申请公布号 JPS61147159(A) 申请公布日期 1986.07.04
申请号 JP19840270232 申请日期 1984.12.20
申请人 YANAGIDA SANGYO KK 发明人 MORI TOMOSHIGE
分类号 G01B7/00;G01N27/90 主分类号 G01B7/00
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