发明名称 TEST SYSTEM FOR PHOTOCONDUCTION CHANGEOVER CIRCUIT
摘要 PURPOSE:To switch the conduction of light, to make a connection between coupled connectin utilizing devices, and to make a changeover connection and test a photo-conduction changeover circuit by installing a testing circuit beside the photoconduction changeover circuit. CONSTITUTION:The photoconduction changeover cirucit 1 switches the conduc tion of light between internal paths x1-x10 and y1-y10, and among conduction changeover parts z1.1-z10-10, thereby making connections and changeover connections among connection utilizing devices coupled with the internal paths x1-x10, and y1-y10. Further, a controller 2 controls the changeover operation of a circuit 1. Then, a test device 3 is provided with test device circuits C1-C3 and D1-D3 from the device 3 beside the circuit 1, and those are coupled with the internal circuits y1, y2, y10, x1, x2, and x10 to constitute and install test circuits c1-y1, c2-y2, c3-y10, D1-x1, D2-x2, and D3-x10. Thus, the test circuits are provided on sides of the circuit 11 to demarcate inward and outward connec tion by intenal path connections are external path connections distinctively, thereby taking a test in association with the device 3.
申请公布号 JPS61147127(A) 申请公布日期 1986.07.04
申请号 JP19840271109 申请日期 1984.12.20
申请人 UENO KAZUHIKO 发明人 UENO KAZUHIKO
分类号 G01M11/00;H04M3/26;H04Q1/20;H04Q1/24;H04Q3/52 主分类号 G01M11/00
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